[IEEE] Impact Analysis of Stacked Machine Learning Algorithms Based Feature Selections for Deep Learning Algorithm Applied to Regression Analysis |
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Characterization of Al and Ni-P Films as Hardmasks for the ICP-RIE Plasma Etching Bosch Process
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Piezoelectric Based MEMS Acoustic Sensor for Wide Frequency Applications
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Economics models and policies for cloud federations
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Being Human in the Digitally Enabled Workplace: Insights From the Robo-Advice Literature
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Personalised Diet Recommendation System Using Bandits