Study on the Single-Event Burnout Mechanism of Ka-Band GaN MMIC Power Amplifiers Under Heavy Ion Irradiation

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journal：IEEE Transactions on Electron Devices

Authors：Li Zhang; Xuefeng Zheng; Danmei Lin; Hao Zhang; Xiaohu Wang; Kang Li; Shunyu Wang; Fang Zhang; Yingzhe Wang; Peipei Hu; Jie Liu; Xiaohua Ma; Yue Hao

Published date：2026-5-

DOI：10.1109/ted.2026.3678900

PDF link：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=11481476

Article link：https://doi.org/10.1109/ted.2026.3678900

Article Source：Institute of Electrical and Electronics Engineers (IEEE)。

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[IEEE] Study on the Single-Event Burnout Mechanism of Ka-Band GaN MMIC Power Amplifiers Under Heavy Ion Irradiation

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