[IEEE] Real-Time Defect Classification in Manufacturing using Machine Learning and Image Processing

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journalㄩ2026 International Conference on Visual Analytics and Data Visualization (ICVADV)

AuthorsㄩVijayakumar K; Vignesh S; K. Gayathri

Published dateㄩ2026-2-24

DOIㄩ10.1109/icvadv67766.2026.11470348

PDF linkㄩhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=11470348

Article linkㄩhttps://doi.org/10.1109/icvadv67766.2026.11470348

Article SourceㄩIEEE﹝


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Real-Time Defect Classification in Manufacturing using Machine Learning and Image Processing

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