journal:IEEE Microwave Magazine
Authors:Pengzhan Liu; Zhongmao Li; Wen Fu; Junjian Yin; Xin Qiu; Tianchun Ye
Published date:2022-9-
DOI:10.1109/mmm.2022.3180511
Article link:http://dx.doi.org/10.1109/mmm.2022.3180511
Article Source:Institute of Electrical and Electronics Engineers (IEEE)。
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