[SPIE] Artificial intelligence process control: deep reinforcement learning for Ga2O3 wafer production

ilmondo Post time 7 day(s) ago | Show all posts |Read mode
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journalㄩOxide-based Materials and Devices XIV

AuthorsㄩSarah Constantin; Matthew Putman; Valerie Bordelanne

Published dateㄩ2023-3-16

DOIㄩ10.1117/12.2668706

Article linkㄩhttps://doi.org/10.1117/12.2668706

Article SourceㄩSPIE﹝


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jakir_ete_ruet Post time 7 day(s) ago | Show all posts

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