[SPIE] Subwavelength van der Waals GeSe arrays for enhanced weak-light polarization photodetection |
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Subwavelength van der Waals GeSe arrays for enhanced weak-light polarization photodetection
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512-element linear InGaAs APD array sensor for scanned time-of-flight lidar at 1550 nm
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High-resolution multicolumn electron beam inspection for EUV reticle development and production
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[Supplementary]High resolution event time tagger with ultra short dead-time
