[Elsevier] Numerical modeling of FS-trench IGBTs by TCAD and its parameter extraction method

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journalㄩMicroelectronics Reliability

AuthorsㄩXiao Ma; Yongle Huang; Xin Tang; Yifei Luo; Haonan Shen; Fei Xiao

Published dateㄩ2023-8-

DOIㄩ10.1016/j.microrel.2023.115053

PDF linkㄩhttps://www.sciencedirect.com/sc ... 026271423001531/pdf

Article linkㄩhttps://doi.org/10.1016/j.microrel.2023.115053

Article SourceㄩElsevier BV


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