[IEEE] A Knowledge Assistant for Semiconductor Fault Diagnosis Using an LLM-Enhanced Case-Based Reasoning Framework

rifqi_mrf Post time The day before yesterday 06:25 | Show all posts |Read mode
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journalㄩ2025 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)

AuthorsㄩHyunseop Park; Hyungjae Yoo; Junho Lee; Jaegun Kim; Hyunwoo Cha; Minah Park; Davin Lee; Sungmin Cho; Euisuk Kum

Published dateㄩ2025-12-7

DOIㄩ10.1109/ieem63636.2025.11357845

PDF linkㄩhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=11357845

Article linkㄩhttps://doi.org/10.1109/ieem63636.2025.11357845

Article SourceㄩIEEE


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aellie Post time The day before yesterday 06:46 | Show all posts

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