[Other] Porosity and Thickness Measurement: A Comparative Analysis of Destructive and Non-Destructive Methods Using Thin Film Porous Silicon

Zeynabmgn Post time Yesterday 23:06 | Show all posts |Read mode
This post will be closed automatically in 2026-06-17 22:49
Reward20points

journalㄩ

AuthorsㄩDanilo  Roque Huanca; Jackelyne  L. M. Villanueva; Adhimar  F. Oliveira; Sebastio  G. Dos Santos Filho

Published dateㄩ--

DOIㄩ10.2139/ssrn.4348581

Article linkㄩhttps://doi.org/10.2139/ssrn.4348581

Article SourceㄩElsevier BV


Remarkㄩ
Reply

Use magic Donate Report

All Reply1 Show all posts
ehkimosis Post time Half hour(s) ago | Show all posts

Waiting for confirmation

If the PDF has not been accepted after 72 hours, the system will automatically adopt it.
Reply

Use magic Donate Report

Junior Member
  • post

  • reply

  • points

    50


Daily Top Contributors

Return to the list