[Elsevier] Unsupervised novelty pattern classification of shmoo plots for visualizing the test results of integrated circuits

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journalㄩExpert Systems with Applications

AuthorsㄩHyun Soo Shin; Youngju Kim; Chang Ouk Kim; Sung Ho Park

Published dateㄩ2022-9-

DOIㄩ10.1016/j.eswa.2022.117341

PDF linkㄩhttps://www.sciencedirect.com/sc ... 957417422006984/pdf

Article linkㄩhttps://doi.org/10.1016/j.eswa.2022.117341

Article SourceㄩElsevier BV


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