[IEEE] Edge Computing-Assisted IoT Framework With an Autoencoder for Fault Detection in Manufacturing Predictive Maintenance

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journalㄩIEEE Transactions on Industrial Informatics

AuthorsㄩWenjin Yu; Yuehua Liu; Tharam Dillon; Wenny Rahayu

Published dateㄩ2023-4-

DOIㄩ10.1109/tii.2022.3178732

PDF linkㄩhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=9784867

Article linkㄩhttps://doi.org/10.1109/tii.2022.3178732

Article SourceㄩInstitute of Electrical and Electronics Engineers (IEEE)


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