X-ray photoelectron spectroscopy for identification of morphological defects and disorders in graphene devices

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journal：Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Authors：Pinar Aydogan; Emre O. Polat; Coskun Kocabas; Sefik Suzer

Published date：2016-7-1

DOI：10.1116/1.4954401

PDF link：https://pubs.aip.org/avs/jva/art ... 041516_1_online.pdf

Article link：https://doi.org/10.1116/1.4954401

Article Source：American Vacuum Society。

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