[RSC] A comparative study on defect estimation using XPS and Raman spectroscopy in few layer nanographitic structures

SaranRevathi Post time 5 day(s) ago | Show all posts |Read mode
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journalㄩPhysical Chemistry Chemical Physics

AuthorsㄩK. Ganesan; Subrata Ghosh; Nanda Gopala Krishna; S. Ilango; M. Kamruddin; A. K. Tyagi

Published dateㄩ--

DOIㄩ10.1039/c6cp02033j

PDF linkㄩhttp://pubs.rsc.org/en/content/articlepdf/2016/CP/C6CP02033J

Article linkㄩhttps://doi.org/10.1039/c6cp02033j

Article SourceㄩRoyal Society of Chemistry (RSC)


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