Temperature Induced Variations in Electrical Characteristics and Performance of Gate All Around FET

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journal：2026 8th International Conference on Inventive Material Science and Applications (ICIMA)

Authors：Jeevanarao Batakala; K. N. Rathnam; Padmaja Kadali; Boya Siva Krishna; Ellapu Bhanu Prakash

Published date：2026-5-13

DOI：10.1109/icima68728.2026.11564072

PDF link：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=11564072

Article link：https://doi.org/10.1109/icima68728.2026.11564072

Article Source：IEEE。

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