[Elsevier] The multi-mode reverse time migration for defect characterization using ultrasonic array

alexmaroc Post time 4 day(s) ago | Show all posts |Read mode
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journalㄩNDT & E International

AuthorsㄩAbhishek Saini; Jinwei Fang; Huaigu Tang

Published dateㄩ2025-4-

DOIㄩ10.1016/j.ndteint.2024.103293

PDF linkㄩhttps://www.sciencedirect.com/sc ... 963869524002585/pdf

Article linkㄩhttps://doi.org/10.1016/j.ndteint.2024.103293

Article SourceㄩElsevier BV


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