Coupling of an External Circuit Model With a Plasma Fluid Model With a Time-Step Size Refinement (TSSR) Algorithm

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journal：IEEE Transactions on Plasma Science

Authors：Hsing-Che Tsai; Kuan-Lin Chen; Yun-Min Lee; Meng-Hua Hu; Jong-Shinn Wu

Published date：2026--

DOI：10.1109/tps.2026.3695139

PDF link：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=11568909

Article link：https://doi.org/10.1109/tps.2026.3695139

Article Source：Institute of Electrical and Electronics Engineers (IEEE)。

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[IEEE] Coupling of an External Circuit Model With a Plasma Fluid Model With a Time-Step Size Refinement (TSSR) Algorithm