[Other] Machine Learning–Assisted Thin-Film Transistor Characterization: A Case Study of Amorphous Indium Gallium Zinc Oxide (IGZO) Thin-Film Transistors

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journal:ECS Journal of Solid State Science and Technology

Authors:Jiwon Oh; Hyewon Song; Euncheol Shin; Heesun Yang; Jongtae Lim; Jin-Ha Hwang

Published date:2022-5-1

DOI:10.1149/2162-8777/ac6894

PDF link:https://iopscience.iop.org/article/10.1149/2162-8777/ac6894

Article link:https://doi.org/10.1149/2162-8777/ac6894

Article Source:The Electrochemical Society


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