[IOP] Generalization bounds and sample complexity for remaining useful life prediction from complete degradation trajectories

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journalㄩMeasurement Science and Technology

AuthorsㄩHuy Hoang Le; Kim-Anh Nguyen

Published dateㄩ2026-5-29

DOIㄩ10.1088/1361-6501/ae7109

PDF linkㄩhttps://iopscience.iop.org/article/10.1088/1361-6501/ae7109

Article linkㄩhttps://doi.org/10.1088/1361-6501/ae7109

Article SourceㄩIOP Publishing


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