[SPIE] Research on a YOLOv5-based crack detection system for naval ships

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journalㄩFourth International Conference on Machine Vision, Automatic Identification, and Detection (MVAID 2025)

AuthorsㄩKerui Cheng; Bowen Chen; Ye Wu; Yuancheng Le; Juan Huang; Zihao Yue; Jiandong Zhang

Published dateㄩ2025-9-19

DOIㄩ10.1117/12.3077345

Article linkㄩhttps://doi.org/10.1117/12.3077345

Article SourceㄩSPIE


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