[ACS] Dopant-Induced Defect Engineering in Transition Metal Oxide/Chalcogenide-Based Electrodes for High-Performance Supercapacitors: A Critical Review

Marimuthuphy Post time Yesterday 11:13 | Show all posts |Read mode
This post will be closed automatically in 2026-07-01 11:12
Reward10points

journalㄩACS Applied Energy Materials

AuthorsㄩSubin Kaladi Chondath; Love Bansal; Bhumika Sahu; Rajesh Kumar

Published dateㄩ2025-7-14

DOIㄩ10.1021/acsaem.5c00655

PDF linkㄩhttps://pubs.acs.org/doi/pdf/10.1021/acsaem.5c00655

Article linkㄩhttps://doi.org/10.1021/acsaem.5c00655

Article SourceㄩAmerican Chemical Society (ACS)


Remarkㄩ

Best Answer

Please approve

View Full Content

Reply

Use magic Donate Report

All Reply1 Show all posts
Victor91 Post time Yesterday 11:13 | Show all posts

This post has been completed

Completed attachments will be deleted within 24 hours.
Reply

Use magic Donate Report

Return to the list