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[IEEE] Optimizing System Loss through Data-Driven Inspection Deployment: A Cluster-Level Electricity Theft Analysis Approach

stude191212 Post time Yesterday 16:33 | Show all posts |Read mode
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journalㄩ2025 25th Conference of the Electric Power Supply Industry (CEPSI)

AuthorsㄩJuan Miguel Bunagan; Ren Christian Santos; Kathleen Borja; Aldwin Sta. Rosa; James Emmanuelle Lafuente; Von Edward Marquez

Published dateㄩ2025-10-28

DOIㄩ10.1109/cepsi66359.2025.11403857

PDF linkㄩhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=11403857

Article linkㄩhttps://doi.org/10.1109/cepsi66359.2025.11403857

Article SourceㄩIEEE﹝


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