[Other] Impact of temperature on threshold voltage instability under negative bias in ferroelectric charge trap (FEG) GaN-HEMT

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journalㄩApplied Physics Letters

AuthorsㄩShivendra K. Rathaur; Abhisek Dixit; Edward Yi Chang

Published dateㄩ2024-9-2

DOIㄩ10.1063/5.0211768

PDF linkㄩhttps://pubs.aip.org/aip/apl/art ... 104_1_5.0211768.pdf

Article linkㄩhttps://doi.org/10.1063/5.0211768

Article SourceㄩAIP Publishing


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