[Other] Rapid Imaging of Carrier Density of Si Using Reflectance Measurement in the Terahertz Region

stefamaru Post time Yesterday 19:04 | Show all posts |Read mode
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journalㄩMaterials Science Forum

AuthorsㄩAkihide Hamano; Yoshinobu Takatsu; Seigo Ohno; Hiroaki Minamide; Hiromasa Ito; Yoshiyuki Usuki

Published dateㄩ--

DOIㄩ10.4028/www.scientific.net/msf.725.227

PDF linkㄩhttps://www.scientific.net/MSF.725.227.pdf

Article linkㄩhttps://doi.org/10.4028/www.scientific.net/msf.725.227

Article SourceㄩTrans Tech Publications, Ltd.


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