[Elsevier] Attention mechanism in intelligent fault diagnosis of machinery: A review of technique and application

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journalㄩMeasurement

AuthorsㄩHaixin Lv; Jinglong Chen; Tongyang Pan; Tianci Zhang; Yong Feng; Shen Liu

Published dateㄩ2022-8-

DOIㄩ10.1016/j.measurement.2022.111594

PDF linkㄩhttps://www.sciencedirect.com/sc ... 263224122008077/pdf

Article linkㄩhttps://doi.org/10.1016/j.measurement.2022.111594

Article SourceㄩElsevier BV


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