[Elsevier] Image resolution enhancement method of scanning acoustic microscope for semiconductor inspection

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journalㄩNDT & E International

AuthorsㄩHao Liang; Jian Xue; Ke Lu

Published dateㄩ2025-9-

DOIㄩ10.1016/j.ndteint.2025.103328

PDF linkㄩhttps://www.sciencedirect.com/sc ... 96386952500009X/pdf

Article linkㄩhttps://doi.org/10.1016/j.ndteint.2025.103328

Article SourceㄩElsevier BV


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