[Elsevier] Depth estimation of internal defects from a sensitive frequency using thermal wave radar

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journalㄩNDT & E International

AuthorsㄩLijun Zhuo; Yifan Xu; Jianguo Zhu; Hongchu Chen; Qiang Yang

Published dateㄩ2025-9-

DOIㄩ10.1016/j.ndteint.2025.103367

PDF linkㄩhttps://www.sciencedirect.com/sc ... 963869525000489/pdf

Article linkㄩhttps://doi.org/10.1016/j.ndteint.2025.103367

Article SourceㄩElsevier BV


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