[IEEE] Remaining Useful Life Prediction of SiC MOSFETs Using the Autoformer-RELM Model

killadimwon Post time 7 day(s) ago | Show all posts |Read mode
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journalㄩIEEE Transactions on Instrumentation and Measurement

AuthorsㄩWei Luo; Yufan Liu; Yili Pan; Lin Bai

Published dateㄩ2025--

DOIㄩ10.1109/tim.2025.3579735

PDF linkㄩhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=11036829

Article linkㄩhttps://doi.org/10.1109/tim.2025.3579735

Article SourceㄩInstitute of Electrical and Electronics Engineers (IEEE)


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