[IEEE] Automated Invigilation System for Offline Exam Monitoring Using Deep Learning

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journalㄩ2024 International Conference on Data Science and Network Security (ICDSNS)

AuthorsㄩThatikonda Sree Vally; Mukhtar Ahmad Sofi; Manjitha Mudiyala; Sai Sree Bakki; Pattam Meghana

Published dateㄩ2024-7-26

DOIㄩ10.1109/icdsns62112.2024.10691184

PDF linkㄩhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10691184

Article linkㄩhttps://doi.org/10.1109/icdsns62112.2024.10691184

Article SourceㄩIEEE


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