[Other] Multiple environmental test and genetic mapping jointly reveal genomic loci and associated genes underlying cotton Verticillium wilt resistance.

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Zhang, Y., Zhao, L., Li, Z. et al. Multiple environmental test and genetic mapping jointly reveal genomic loci and associated genes underlying cotton Verticillium wilt resistance. Theor Appl Genet 139, 209 (2026). https://doi.org/10.1007/s00122-026-05320-8
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