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[SPIE] Intelligent manufacturing quality inspection system based on multiobjective optimization

Zhijiang Post time 5 day(s) ago | Show all posts |Read mode
This post will be closed automatically in 2026-07-29 19:24
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journalㄩInternational Conference on Optical Communication and Intelligent Algorithms (OCIA 2026)

AuthorsㄩYuhui Sun; Zijie Xu; Mingtan Li

Published dateㄩ2026-7-10

DOIㄩ10.1117/12.3117495

Article linkㄩhttps://doi.org/10.1117/12.3117495

Article SourceㄩSPIE﹝


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