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journalㄩOptical Measurement Systems for Industrial Inspection XI
AuthorsㄩJan Sch邦tz; Alexander Blttermann; Peter Kozlowski; Albrecht Brandenburg
Published dateㄩ2019-6-21
DOIㄩ10.1117/12.2525584
Article linkㄩhttps://doi.org/10.1117/12.2525584
Article SourceㄩSPIE﹝
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