Signal Integrity Design and Analysis of a Multilayer Test Interposer for LPDDR4 Memory Test With Silicone Rubber-Based Sheet Contact

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journal：IEEE Transactions on Electromagnetic Compatibility

Authors：Jonghoon J. Kim; Heegon Kim; Daniel H. Jung; Sumin Choi; Jaemin Lim; Youngwoo Kim; Junyong Park; Hyesoo Kim; Dongho Ha; Michael Bae; Joungho Kim

Published date：2017-8-

DOI：10.1109/temc.2016.2639524

PDF link：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=7802621

Article link：https://doi.org/10.1109/temc.2016.2639524

Article Source：Institute of Electrical and Electronics Engineers (IEEE)。

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