Inline Characterization of Polysilicon Layers in TOPCon Solar Cell Precursors With Reflectance Spectroscopy

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journal：IEEE Journal of Photovoltaics

Authors：Saravana Kumar; Hari Narayan; Christian Diestel; Jurriaan Schmitz; Jonas Haunschild; Stefan Rein; Stefan J. Rupitsch

Published date：2026-1-

DOI：10.1109/jphotov.2025.3619977

PDF link：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=11234887

Article link：https://doi.org/10.1109/jphotov.2025.3619977

Article Source：Institute of Electrical and Electronics Engineers (IEEE)。

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[IEEE] Inline Characterization of Polysilicon Layers in TOPCon Solar Cell Precursors With Reflectance Spectroscopy

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[IEEE] Inline Characterization of Polysilicon Layers in TOPCon Solar Cell Precursors With Reflectance Spectroscopy