Evolution of High Dielectric Permittivity in Low-Temperature Solution Combustion-Processed Phase-Pure High Entropy Oxide (CoMnNiFeCr)O for Thin Film Transistors

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journal：ACS Applied Electronic Materials

Authors：Ashritha Salian; Pavan Pujar; Robbi Vivek Vardhan; Haewon Cho; Sunkook Kim; Saumen Mandal

Published date：2023-5-23

DOI：10.1021/acsaelm.3c00094

PDF link：https://pubs.acs.org/doi/pdf/10.1021/acsaelm.3c00094

Article link：https://doi.org/10.1021/acsaelm.3c00094

Article Source：American Chemical Society (ACS)。

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[ACS] Evolution of High Dielectric Permittivity in Low-Temperature Solution Combustion-Processed Phase-Pure High Entropy Oxide (CoMnNiFeCr)O for Thin Film Transistors

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