[Other] Optical Characterization of Semiconducting Thin Films Using UV-VIS-NIR Spectroscopy: A Review

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journalㄩSolid State Phenomena

AuthorsㄩS.D. Dhruv; Sergei A. Sharko; Pankaj Solanki; Mayur Vala; I.T. Thakker; Bharat Kataria; D.K. Dhruv

Published dateㄩ--

DOIㄩ10.4028/p-yaddi5

PDF linkㄩhttps://www.scientific.net/SSP.350.115.pdf

Article linkㄩhttps://doi.org/10.4028/p-yaddi5

Article SourceㄩTrans Tech Publications, Ltd.


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