[IEEE] Explainability of Subfield Level Crop Yield Prediction Using Remote Sensing

Ashikag Post time The day before yesterday 15:11 | Show all posts |Read mode
This post will be closed automatically in 2026-08-01 15:11
Reward30points

journalㄩIEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing

AuthorsㄩHiba Najjar; Miro Miranda; Marlon Nuske; Ribana Roscher; Andreas Dengel

Published dateㄩ2025--

DOIㄩ10.1109/jstars.2025.3528068

PDF linkㄩhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10836770

Article linkㄩhttps://doi.org/10.1109/jstars.2025.3528068

Article SourceㄩInstitute of Electrical and Electronics Engineers (IEEE)


Remarkㄩ
Reply

Use magic Donate Report

All Reply1 Show all posts
muktadir.rahman Post time The day before yesterday 15:17 | Show all posts

Waiting for confirmation

If the PDF has not been accepted after 72 hours, the system will automatically adopt it.
Reply

Use magic Donate Report

Return to the list