[Elsevier] Hot carrier stress in junctionless gate-all-around nMOSFETs under different bias conditions

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journalㄩSolid-State Electronics

AuthorsㄩWen-Teng. Chang; Liang-I. Cai; Hung-Hsi Chen; Jen-Chien Li; Yao-Jen Lee

Published dateㄩ2025-11-

DOIㄩ10.1016/j.sse.2025.109187

PDF linkㄩhttps://www.sciencedirect.com/sc ... 038110125001327/pdf

Article linkㄩhttps://doi.org/10.1016/j.sse.2025.109187

Article SourceㄩElsevier BV


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