[IEEE] Reinvestigation on Subthreshold Swing of Gate-All-Around Nanosheet FETs in Quantum Limit for Voltage Scaling

asdfgxcv34@ Post time Yesterday 14:46 | Show all posts |Read mode
This post will be closed automatically in 2026-08-02 14:45
Reward30points

journalㄩIEEE Transactions on Electron Devices

AuthorsㄩYaoping Xiao; Yuxuan Wang; Xiaoran Mei; Tomoko Mizutani; Takuya Saraya; Toshiro Hiramoto; Masaharu Kobayashi

Published dateㄩ2026--

DOIㄩ10.1109/ted.2026.3702663

PDF linkㄩhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=11578422

Article linkㄩhttps://doi.org/10.1109/ted.2026.3702663

Article SourceㄩInstitute of Electrical and Electronics Engineers (IEEE)


Remarkㄩ
Reply

Use magic Donate Report

All Reply1 Show all posts
Sweetums33 Post time Yesterday 14:47 | Show all posts

Waiting for confirmation

If the PDF has not been accepted after 72 hours, the system will automatically adopt it.
Reply

Use magic Donate Report

Return to the list