[IEEE] Die to Wafer Hybrid Bonding: Multi-Die Stacking with Tsv Integration

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journalㄩ2020 International Wafer Level Packaging Conference (IWLPC)

AuthorsㄩGuilian Gao; Jeremy Theil; Gill Fountain; Thomas Workman; Gabe Guevara; Cyprian Uzoh; Dominik Suwito; Bongsub Lee; K.M. Bang; Rajesh Katkar; Laura Mirkarimi

Published dateㄩ2020-10-13

DOIㄩ10.23919/iwlpc52010.2020.9375884

PDF linkㄩhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=9375884

Article linkㄩhttps://doi.org/10.23919/iwlpc52010.2020.9375884

Article SourceㄩIEEE


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Sweetums33 Post time Yesterday 20:48 | Show all posts

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