[IOP] Thickness-dependent structural and growth evolution in relation to dielectric relaxation behavior and correlated barrier hopping conduction mechanism in Ni0.5Co0.5Fe2O4 ferrite thin films |
Reward10points
|
10
Thickness-dependent structural and growth evolution in relation to dielectric relaxation behavior and correlated barrier hopping conduction mechanism in Ni0.5Co0.5Fe2O4 ferrite thin films
10
Spectrally selective Goos-Hnchen displacement in a single defect helical photonic crystal
10
Effect of an inclined magnetic field on unsteady mixed convective stagnation point flow over a permeable stretching sheet with radiative heat transfer
10
A geometric approach to Fermat principle as a demonstration of high school geometry and physical optics
10
Numerical simulations of 22% efficient all-perovskite tandem solar cell utilizing lead-free and low lead content halide perovskites
