[Other] Two-dimensional metals thickness scaling effect on electrical contact in metal每semiconductor junctions: Carrier transport and ultrafast dynamics study

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journalㄩApplied Physics Letters

AuthorsㄩZifan Niu; Wenchao Shan; Xinxin Wang; Xiuyun Zhang; Anqi Shi; Ying Zhang; Xianghong Niu

Published dateㄩ2025-10-6

DOIㄩ10.1063/5.0274847

PDF linkㄩhttps://pubs.aip.org/aip/apl/art ... 601_1_5.0274847.pdf

Article linkㄩhttps://doi.org/10.1063/5.0274847

Article SourceㄩAIP Publishing


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