[Other] Failure Case Studies of GaAs-Based Oxide-Confined VCSELs

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journalㄩInternational Symposium for Testing and Failure Analysis

AuthorsㄩKuang-Tse Ho; Cheng-Che Li

Published dateㄩ2021-10-31

DOIㄩ10.31399/asm.cp.istfa2021p0296

PDF linkㄩhttps://dl.asminternational.org/ ... /istfa2021p0296.pdf

Article linkㄩhttps://doi.org/10.31399/asm.cp.istfa2021p0296

Article SourceㄩASM International


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