[Elsevier] Fracture morphologies and simulation stress of low-temperature SnBiIn/Cu solder interconnect under shear mechanical test

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journalㄩMaterials Characterization

AuthorsㄩSunwu Xu; Pengyu Zhu; Yifei Li; Xinyi Jing; Peng He; Shuye Zhang

Published dateㄩ2025-2-

DOIㄩ10.1016/j.matchar.2024.114679

PDF linkㄩhttps://www.sciencedirect.com/sc ... 04458032401060X/pdf

Article linkㄩhttps://doi.org/10.1016/j.matchar.2024.114679

Article SourceㄩElsevier BV


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