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[IEEE] [Other]FruitNet: Automated Deep Learning Model for Detecting Damaged Fruits

pranavvey Post time 2026-8-14 13:13:38 | Show all posts |Read mode
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journalㄩ2025 IEEE Madhya Pradesh Section Conference (MPCON)

AuthorsㄩSyed Ameerulhaq; Mohebbanaaz Mohebbanaaz; P Sandeep Reddy

Published dateㄩ2025-8-29

DOIㄩ10.1109/mpcon66082.2025.11256677

PDF linkㄩhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=11256677

Article linkㄩhttps://doi.org/10.1109/mpcon66082.2025.11256677

Article SourceㄩIEEE﹝


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