Robust Design-for-Security Architecture for Enabling Trust in IC Manufacturing and Test

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journal：IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Authors：Ujjwal Guin; Ziqi Zhou; Adit Singh

Published date：2018-5-

DOI：10.1109/tvlsi.2018.2797019

PDF link：https://ieeexplore.ieee.org/ielaam/92/8345376/8290974-aam.pdf

Article link：https://doi.org/10.1109/tvlsi.2018.2797019

Article Source：Institute of Electrical and Electronics Engineers (IEEE)。

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