[Taylor&Francis] A physics-constrained and data-driven framework for electrical capacitance tomography

Vu_Haimie Post time Yesterday 11:52 | Show all posts |Read mode
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journalㄩNondestructive Testing and Evaluation

AuthorsㄩKai Li; Chunman Yan

Published dateㄩ--

DOIㄩ10.1080/10589759.2026.2687877

PDF linkㄩhttps://www.tandfonline.com/doi/pdf/10.1080/10589759.2026.2687877

Article linkㄩhttps://doi.org/10.1080/10589759.2026.2687877

Article SourceㄩInforma UK Limited


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zpsukhan Post time Yesterday 11:52 | Show all posts

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