A Silhouette-Optimized Density Clustering Framework for Paddy Yield Profiling Across Heterogeneous Environmental and Operational Embeddings

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journal：2026 4th International Conference on Sustainable Computing and Smart Systems (ICSCSS)

Authors：Japhet P. Fulmaran; Felicisimo V. Wenceslao; Chester L. Cofino; Ryan B. Esocrial; Van Roger B. Gutib; Don C. Opada

Published date：2026-7-

DOI：10.1109/icscss69635.2026.11645692

PDF link：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=11645692

Article link：https://doi.org/10.1109/icscss69635.2026.11645692

Article Source：IEEE。

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[IEEE] A Silhouette-Optimized Density Clustering Framework for Paddy Yield Profiling Across Heterogeneous Environmental and Operational Embeddings