[Elsevier] Space radiation induced failure rate calculation method using energy deposition probability function for high-voltage semiconductor device

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journalㄩMaterials Today Communications

AuthorsㄩLuvsanbat Khurelbaatar; Turtogtokh Tumenjargal; Begzsuren Tumendemberel; Otgonbaatar Myagmar; Srikanth Gollapudi; Ichiro Omura; Erdenebaatar Dashdondog

Published dateㄩ2023-6-

DOIㄩ10.1016/j.mtcomm.2023.105499

PDF linkㄩhttps://www.sciencedirect.com/sc ... 352492823001897/pdf

Article linkㄩhttps://doi.org/10.1016/j.mtcomm.2023.105499

Article SourceㄩElsevier BV


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