[Elsevier] AIoT-enabled defect detection with minimal data: A few-shot learning approach combining prototypical and relational networks for smart manufacturing

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journal：Internet of Things

Authors：Chih-Cheng Chen; Hsien-Yang Liao; Chun-You Liu

Published date：2024-10-

DOI：10.1016/j.iot.2024.101327

PDF link：https://www.sciencedirect.com/sc ... 542660524002683/pdf

Article link：https://doi.org/10.1016/j.iot.2024.101327

Article Source：Elsevier BV。

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[Elsevier] AIoT-enabled defect detection with minimal data: A few-shot learning approach combining prototypical and relational networks for smart manufacturing Copy