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[IEEE] A Novel RUL Prediction Framework Considering the Long-Term Correlation of the Wiener Degradation Process

xiexiuzhi Post time 7 day(s) ago | Show all posts |Read mode
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journal：IEEE Transactions on Industrial Electronics

Authors：Jialong He; Pingting Zhao; Yan Liu; Guofa Li; Liang Wang

Published date：2026-8-

DOI：10.1109/tie.2026.3672771

PDF link：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=11455962

Article link：https://doi.org/10.1109/tie.2026.3672771

Article Source：Institute of Electrical and Electronics Engineers (IEEE)。


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